Photoemission spectroscopies like XPS and UPS are techniques used to determine the electronic configuration of materials by analysing the kinetic energy of the electrons ejected from the material by photoelectric effect under irradiation using X ray (XPS) or UV light (UPS). Both techniques are surface sensitive and need the sample is placed in ultra-high vacuum (UHV) to protect their surface from contaminations. The XUV beamlines and their experimental chambers give the possibility to perform this kind of studies using the high photon flux in this energy range produced by DAFNE.


Spokesperson: Roberto Cimino